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Channel: design for test (DFT) – Tech Design Forum Techniques
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Silicon test moves up the food chain

Technological advances are often driven by the need to simplify and control a task. Silicon test is a good example. Its requirements are continuously increasing in complexity and this process drives...

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Innovations at ITC 2010

MEMS device interface board A traditional device interface board (DIB) degrades significantly at the very high frequencies that need to be used to fully test today’s devices, but what about a DIB based...

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Ensuring the reliability of non-volatile memory in SoC designs

Non-volatile memory (NVM) is beginning to occupy more real estate on system-on-chip (SoC) designs in process geometries at and below 65nm. NVM is essential to store data for trimming analog and...

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Why cell-aware testing is important

The goal of silicon testing is to find defective parts before they are shipped to the customer. We measure our success (or failure) to do this in defects-per-million (DPM), and the lower the number,...

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20nm test demands new design-for-test and diagnostic strategies

The introduction of 20nm manufacturing processes brings new yield challenges that influence design-for-test (DFT) strategies. At 20nm, defect densities higher, and there are significant on-chip process...

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IJTAG: delivering an industry platform for IP test and integration

Integrating and testing IP blocks in large SoCs is typically a time consuming, manual effort. The IEEE proposed standard P1687 (‘IJTAG’) aims to solve this problem. IJTAG lets IP providers and SoC...

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